This standard specifies the basic methods for testing the electrical parameters, time parameters, and storage unit functions of semiconductor integrated circuit flash memory. This standard is applicable to the testing of electrical parameters, time parameters, and storage unit functions of flash memory in the field of semiconductor integrated circuits. 2 Normative references. The following documents are essential for the application of this document. For dated references, only the dated version applies to this document. For undated references, the latest version (including all modification orders) applies to this document. GB/T 17574-1998 Semiconductor Devices - Integrated Circuits - Part 2: Digital Integrated Circuits - Terms and Definitions - The following terms and definitions apply to this document. 3.1 Flash memory is a non volatile memory with electrically erasable and programmable characteristics, mainly characterized by the ability to quickly read and write large blocks. The worst-case condition is formed by simultaneously applying the most unfavorable conditions of power supply voltage, input signal, and load within the nominal range to the tested flash memory. 4- General Requirements 4.1 Equipment and Conditions: The electrical characteristic testing of flash memory is not limited to specific methods and equipment, and should be conducted on an automatic testing system, including but not limited to testing machines, probe stations, high and low temperature impact equipment, and oscilloscopes. During electrical parameter testing, a test vector should be developed to ensure that the flash memory is in the required working state before testing can begin. The general requirements for the test vector should comply with the provisions of 4.2. The testing process can be found in Appendix A. Unless otherwise specified, flash memory testing should be conducted within the range of environmental air pressure of 86kPa~106kPa and relative humidity of 35%~80%. The testing temperature should comply with the provisions of Section 1, Section 2.1.2 of Part I of GB/T 17574-1998. The worst-case scenario for testing different parameters may be different. If not all test conditions are taken as the most unfavorable value, a "partial worst-case scenario" should be used to distinguish and the deviation from the worst-case scenario should also be indicated
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