This standard specifies the testing methods for voltage regulators (hereinafter referred to as devices) parameters. This standard is applicable to the testing of voltage regulator parameters in semiconductor integrated circuit leaders. The following terms and definitions apply to this document. 2.1 Voltage regulation The rate of change in output voltage that occurs with changes in input voltage. Usually, the voltage regulation rate is determined by changing the DC input voltage and the corresponding output voltage change. 2.2 Current regulation The rate of change in output voltage with changes in output current, usually determined by changing the DC output current and measuring the corresponding DC output voltage change. 2.3 Power supply rejection ratio is the ratio of the change in input power supply to the change in output voltage. 2.4 Output voltage temperature coefficient The rate of change in output voltage with changes in ambient temperature, usually determined by changing the ambient temperature and recording the corresponding output voltage changes. 2.5 Long term stability of output voltage The rate of change of output voltage over time is determined by testing the change of output voltage value over time. 2.6 Output Voltage Noise The noise generated by the device itself at the output voltage, usually measured at the specified DC input voltage, is the interference of the internal circuit of the device on the output voltage. 2.7 Dissipative Current and Dissipative Current Changes The ground terminal current value at which the input voltage and output current are specified. The change in dissipative current is determined when the input and output conditions change. The dissipative current measured when the output current is "0" is also known as the static current (I,). 2.8 Short circuit current The output current of a device when there is a short circuit at its output end. The short circuit current is usually measured at the specified input voltage
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