This standard specifies the grades, classifications, requirements, test methods, inspection rules, marking, packaging, transportation, storage, quality certificates, and purchase orders (or contracts) of silicon single crystals (referred to as silicon single crystals) for solar cells. This standard applies to quasi square or square silicon single crystals processed from circular silicon single crystals prepared by Czochralski doping. The product is cut into silicon wafers and further manufactured into solar cells. The following normative references are essential for the application of this document. For dated references, only the dated version applies to this document. For undated references, the latest version (including all modification orders) applies to this document. GB/T 1550 Test Methods for Conductive Types of Non Intrinsic Semiconductor Materials GB/T 1551 Measurement Method for Resistivity of Silicon Single Crystals GB/T 1554 Chemical Selective Corrosion Testing Method for Integrity of Silicon Crystals GB/T 1555 Determination of Crystal Orientation of Semiconductor Single Crystals GB/T 1557 Infrared Absorption Measurement Method for Oxygen Content in Intermediate Gaps of Silicon Crystals GB/T 1558 Infrared Absorption Measurement Method for Substituted Carbon Atom Content in Silicon GB/T 6616 Test Method for Resistivity of Semiconductor Silicon Wafers and Resistance of Silicon Thin Films Non contact Eddy Current Flow Method GB/T 11073 Measurement Method for Radial Resistivity Change of Silicon Wafers GB/T 14140 Measurement Method for Silicon Wafer Diameter GB/T 14264 Terminology of Semiconductor Materials GB/T 14844 Expression Method for Semiconductor Material Grades GB/T 26068 Contactless Microwave Reflection Photoconductivity Attenuation Test Method for Carrier Composite Life of Silicon Wafers GB/T 32651 Test Method for Measuring Trace Elements in Solar Grade Silicon by High Quality Resolution Glow Discharge Mass Spectrometry YS/T 28 Silicon Wafer Packaging YS/T 679 Non Intrinsic Steady state surface photovoltage testing method for minority carrier diffusion length in semiconductors
Function of testing report:
1. Project bidding: Issue authoritative third-party CMA/CNAS qualification report
2. Online e-commerce platform entry: Quality inspection report recognized by major e-commerce platforms 3. Used as a sales report: issuing legally effective testing reports to make consumers more confident 4. Papers and research: Provide professional personalized testing needs 5. Judicial services: providing scientific, fair, and accurate testing data 6. Industrial problem diagnosis: Verify the troubleshooting and correction of industrial production problemsBaijian and testing process:
1. Telephone communication and confirmation of requirements
2. Recommend solutions and confirm quotations 3. Mail samples and arrange testing 4. Progress tracking and result feedback 5. Provide reports and after-sales service 6. If urgent or priority processing is requiredTesting and testing characteristics:
1. The testing industry is fully covered, meeting different testing needs
2. Fully cover the laboratory and allocate localized testing nearby3. Engineers provide one-on-one services to make testing more accurate
4. Free initial testing, with no testing fees charged
5. Self service order delivery for free on-site sampling
6. Short cycle, low cost, and attentive service 7. Possess authoritative qualifications such as CMA, CNAS, CAL, etc 8. The testing report is authoritative and effective, and is generally used in China