1 Scope
This standard specifies the testing methods for voltage regulators (hereinafter referred to as devices) parameters. This standard is applicable to the testing of voltage regulator parameters in the field of semiconductor integrated circuits
2 Terms and Definitions
The following terms and definitions apply to this document. 2.1
Voltage regulation
The rate at which the output voltage changes with the input voltage, usually determined by changing the DC input voltage and measuring the corresponding output voltage change
2.2
Current regulation
The rate at which the output voltage changes with the output current, usually determined by changing the DC output current and measuring the corresponding DC output voltage change
2.3
The power supply rejection ratio is the ratio of the input power supply variation to the output voltage variation.
. 2.4
Output voltage temperature coefficient
The rate of change of output voltage with changes in ambient temperature, usually determined by changing the ambient temperature and recording the corresponding output voltage changes.
2.5
Long term stability of output voltage oufput voltage stability
The rate of change of output voltage over time is determined by testing the change of output voltage value over time.
. 2.6Output noise voltage: oufput voltage noise
The noise generated by the device itself on the output voltage is usually measured at the specified DC input voltage to measure the interference of the internal circuit of the device on the output voltage.
2.7
Dissipative Current and Dissipative Current Changes
The ground current value when the input voltage and output current are specified, and the change in dissipative current is determined when the input and output conditions change.
. The dissipative current measured when the output current is "O" is also known as the static current (I)2.8
Short circuit current
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