1 Scope
This standard specifies the parameter testing methods for bipolar, MOS, junction type field-effect semiconductor integrated circuit analog switches (hereinafter referred to as devices). This standard is applicable to semiconductor integrated circuit analog switches and also to the testing of multiplexer parameters
2 Normative References
The following documents are essential for the application of this document.
. For dated references, only the dated version applies to this document. For undated references, the latest version (including all modification orders) applies to this documentGB/T 17940-2000 Semiconductor Devices - Integrated Circuits - Part 3: Analog Integrated Circuits
3 Terms and Definitions
The following terms and definitions apply to this document.
. 3.1Analog voltage operating range Analog switch range
The voltage range transmitted by the analog switch when the conduction current is at the rated value.
. 3.2On resistance
Simulate the resistance between the two ends of the switch when the switch is on.
. 3.3On resistance match between channels
For devices or analog multiplexers containing multiple analog switches, the maximum difference in the on resistance of each switch.
. 3.4Cut off state drain current drain off leakage
When the analog switch is cut off, the current flowing through the analog switch drain.
. 3.5Cut off state source leakage current source off leakage
The current flowing through the source of the analog switch when the analog switch is cut off.
. 3.6On state leakage current channel on leakage
Simulate the leakage current between the on path of a switch and other parts of the circuit.
. 3.7Switch on time
Under the action of the control signal, simulate the time required for the switch to open.
. 3.8Switch off time
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