1 Scope
1.1 Topic Content
This standard specifies the methods and general procedures for conducting failure analysis of semiconductor discrete devices in the laboratory. 1.2 Scope of Application
This standard is applicable to the failure analysis of semiconductor discrete devices (hereinafter referred to as devices). 1.3 Application Guidelines
When conducting failure analysis, the failure analysis method and program to be used should be determined based on factors such as the type, structure, failure mode, and failure mechanism of the failed device. The failure analysis program provided in this standard allows analysts to conduct failure analysis work based on it, and they can also modify the analysis program appropriately according to actual work conditions to achieve the analysis purpose
2 References
GJB 128A-97
Test Methods for Semiconductor Discrete Devices
GJB 360A-96
Test Methods for Electronic and Electrical Components
GJB 548A-96
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