Scope
1.1 Main Vietnam Domestic Customers
This standard specifies the general test methods for semiconductor discrete devices (hereinafter referred to as devices), including basic environmental tests for damage resistance under military conditions, mechanical performance tests, and electrical characteristic tests
1.2 Scope of Application
This standard is applicable to military semiconductor discrete devices.
. 1.3 Application Guidelines1.3.1 stipulates that the test conditions in the laboratory should be appropriate, so that the test results are equivalent to the results of on-site use, and the test results should be reproducible. But this cannot be understood as the experimental conditions being completely equivalent to the actual working conditions in a certain region, because only the actual working experiments in a certain region are the actual working experiments in that region When using a standard to describe test methods with similar properties in various general semiconductor device specifications, these methods can be kept unified, thereby fully utilizing equipment, facilities, and saving time. To achieve this goal, it is necessary to make each universal test method applicable to multiple devices 1.3.2 When referencing the test methods of this standard in detailed specifications, the standard number, test method number, and the details that should be specified in the referenced test methods should be indicated
Reference
GB3131-88
Tin lead solder
GB4023-86
Semiconductor discrete devices Part 2: Rectifier diodes
G4586-94
Test methods for reverse blocking triode thyristors in semiconductor devices
Semiconductor devices Discrete devices Part 8: Field effect transistors
GB4587-94
Semiconductor devices Discrete devices and integrated circuits Part 7: Bipolar transistors
GB6570-86
Microwave devices bipolar Tube testing methods
GB6571-94
Semiconductor devices - Discrete devices - Part 3: Signal (including switches) and adjustment diodes
GB9491-88
Liquid soldering flux (rosin based) for soldering
GB11499-89
Text symbols for discrete semiconductor devices
GB12300-90
Test methods for safe working area of power transistors
GJB33A-97
Function of testing report:
1. Project bidding: Issue authoritative third-party CMA/CNAS qualification report
2. Online e-commerce platform entry: Quality inspection report recognized by major e-commerce platforms 3. Used as a sales report: issuing legally effective testing reports to make consumers more confident 4. Papers and research: Provide professional personalized testing needs 5. Judicial services: providing scientific, fair, and accurate testing data 6. Industrial problem diagnosis: Verify the troubleshooting and correction of industrial production problemsBaijian and testing process:
1. Telephone communication and confirmation of requirements
2. Recommend solutions and confirm quotations 3. Mail samples and arrange testing 4. Progress tracking and result feedback 5. Provide reports and after-sales service 6. If urgent or priority processing is requiredTesting and testing characteristics:
1. The testing industry is fully covered, meeting different testing needs
2. Fully cover the laboratory and allocate localized testing nearby3. Engineers provide one-on-one services to make testing more accurate
4. Free initial testing, with no testing fees charged
5. Self service order delivery for free on-site sampling
6. Short cycle, low cost, and attentive service 7. Possess authoritative qualifications such as CMA, CNAS, CAL, etc 8. The testing report is authoritative and effective, and is generally used in China