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Electromagnetic compatibility GB 17626.9-2011 IEC 61000-4:9:2001 Electromagnetic compatibility testi
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Electromagnetic compatibility GB 17626.9-2011 IEC 61000-4:9:2001 Electromagnetic compatibility testi
GB/T17626 "Electromagnetic Compatibility Testing and Measurement Techniques" It is divided into the following parts: GB/T17626.1-2006 Electromagnetic Compatibility Testing and Measurement Techniques - General Introduction to Immunity Testing GB/T17626.2-2006 Electromagnetic Compatibility Testing and Measurement Techniques - Electrostatic Discharge Immunity Testing GB/T17626.3-2006 Electromagnetic Compatibility Testing and Measurement Techniques - Radio Frequency Electromagnetic Field Radiation Immunity Testing GB/T17626.4-2008 Electromagnetic Compatibility Testing and Measurement Techniques - Electrical Fast Transient Pulse Group Immunity Test GB/T17626.5-2008 Electromagnetic Compatibility Testing and Measurement technology - Surge (impact) immunity test GB/T17626.6-2008 Electromagnetic compatibility testing and measurement technology - Conducted disturbance immunity induced by radio frequency fields GB/T17626.7-2008 Electromagnetic compatibility testing and measurement technology - Power supply systems and connected equipment harmonics Guidelines for Measurement and Measurement Instruments of Harmonic Waves GB/T17626.8-2006 Electromagnetic Compatibility Testing and Measurement Techniques Power Frequency Magnetic Field Immunity Test GB/T17626.9-2011 Electromagnetic Compatibility Testing and Measurement Techniques Pulse Magnetic Field Immunity Test GB/T17626.10-1998 Electromagnetic Compatibility Testing and Measurement Techniques Damping Oscillation Magnetic Field Immunity Test GB/T17626.11-2008 Electromagnetic Compatibility Testing and Measurement Techniques Voltage Dip Immunity tests for short-term interruptions and voltage changes GB/T17626.12-1998 Electromagnetic compatibility testing and measurement techniques Oscillating wave immunity test GB/T17626.13-2006 Electromagnetic compatibility testing and measurement techniques AC power port harmonics Low frequency immunity tests for harmonic waves and power grid signals GB/T17626.14-2005 Electromagnetic compatibility testing and measurement techniques Voltage fluctuation immunity tests GB/T17626.15-2011 Electromagnetic compatibility testing and measurement techniques Functional and design specifications for scintillators GB/T17626.16-2007 Electromagnetic compatibility testing and measurement techniques 0Hz~150kHz Common mode conducted disturbance immunity tests GB/T17626.17-2005 Electromagnetic compatibility testing and measurement techniques DC power input port ripple Immunity Test GB/T17626.27-2006 Electromagnetic Compatibility Testing and Measurement Techniques - Three Phase Voltage Imbalance Immunity Test GB/T17626.28-2006 Electromagnetic Compatibility Testing and Measurement Techniques - Power Frequency Frequency Change Immunity Test GB/T17626.29-2006 Electromagnetic Compatibility Testing and Measurement Techniques - Immunity Test for Voltage Dips, Short Interruptions, and Voltage Changes at DC Power Input Ports - Part 15 of GB/T17626. This section is drafted in accordance with the rules given in GB/T1.1-2009. This part is equivalent to the international standard IEC61000-4-15:1997+A1:2003 (version 1.1) "Electromagnetic Compatibility Testing and Measurement Techniques - Functional and Design Specifications for Scintillators", and the following editorial modifications have been made: - For the IEC61000-4 series and IEC61010-1 standards cited in the normative reference documents, due to their low version, and considering the frequent revision of these standards, their corresponding national standards have been modified to be quoted without dates; -—— The numbering of Tables 4 to 8 has been adjusted. Table 4 in this section corresponds to Table 8 in IEC61000-4-15:1997+A1:2003, which is a new table added to the 2003 revision; To ensure the continuity of the standard full-text table numbering, the table numbering has been changed to Table 4, and all table numbering has been adjusted in sequence thereafter. This part is proposed and under the jurisdiction of the National Technical Committee for Electromagnetic Compatibility Standardization (SAC/TC246). The drafting units responsible for this part are Shanghai Electric Appliance Science Research Institute and Shanghai Sanji Electronic Industry Co., Ltd. The main drafters of this section are Shou Jianxia, Qian Zhenyu, Ye Qiongyu, Cheng Liling, Meng Zhiping, Liu Yuan, Xiao Xiao, Zheng Junqi, and Liu Xiaodong.Function of testing report:
1. Project bidding: Issue authoritative third-party CMA/CNAS qualification report
2. Online e-commerce platform entry: Quality inspection report recognized by major e-commerce platforms 3. Used as a sales report: issuing legally effective testing reports to make consumers more confident 4. Papers and research: Provide professional personalized testing needs 5. Judicial services: providing scientific, fair, and accurate testing data 6. Industrial problem diagnosis: Verify the troubleshooting and correction of industrial production problemsBaijian and testing process:
1. Telephone communication and confirmation of requirements
2. Recommend solutions and confirm quotations 3. Mail samples and arrange testing 4. Progress tracking and result feedback 5. Provide reports and after-sales service 6. If urgent or priority processing is requiredTesting and testing characteristics:
1. The testing industry is fully covered, meeting different testing needs
2. Fully cover the laboratory and allocate localized testing nearby3. Engineers provide one-on-one services to make testing more accurate
4. Free initial testing, with no testing fees charged
5. Self service order delivery for free on-site sampling
6. Short cycle, low cost, and attentive service 7. Possess authoritative qualifications such as CMA, CNAS, CAL, etc 8. The testing report is authoritative and effective, and is generally used in China