The main methods for detecting the quality of integrated circuits include visual inspection, sensing, voltage detection, resistance detection, current detection, signal injection, substitution, heating and cooling, boosting or lowering, and comprehensive methods. Let's take a look at the summary of methods for judging the quality of integrated circuits
Usually, there are many integrated circuits in a device. When obtaining a faulty integrated circuit device, the general location of the fault should be determined based on the fault phenomenon. Then, through measurement, the possible location of the fault should be gradually reduced, and finally the fault should be found
The visual inspection method is to observe whether the appearance of an integrated circuit is different from normal through the eyes, in order to determine whether the integrated circuit is damaged. Its main maintenance skill is to see which appearance is damaged. A normal integrated circuit appearance is characterized by clear handwriting, undamaged material, smooth surface, and rust free pins. A damaged integrated circuit appearance is characterized by surface cracks, cracks, or scratches, and small holes on the surface. Missing corners, missing blocks, etc
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