Electronics
Quality factor Q detection
Quality factor Q detection
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Quality factor Q detection

Quality factor measurement is a method of determining the basic parameters that characterize the characteristics of resonant circuits in electronic circuits Introduction: Quality factor (Q value) is a basic parameter that characterizes the characteristics of resonant circuits in electronic circuits. The energy relationship of the resonant circuit can also be expressed as the Q value of a certain component (such as an inductor or capacitor), which refers to the Q value of the resonant circuit composed of this component and an ideal lossless component. There are two methods for measuring quality factor: Q-meter method and variable capacitance or variable frequency method The Q-meter method (voltage ratio method) is widely used in the high-frequency range to measure Q values (Figure 1). The basic principle is that the tested part and the internal tuning capacitor (and auxiliary inductor) of the Q meter form a resonant circuit, and the direct reading Q value of the resonant circuit is obtained on the resonant voltmeter by directly calibrating the ratio of the resonant voltage to the excitation voltage. This method can also be used to determine the inductance or capacitance value of the measured object from the tuning capacitor reading. The Q-meter method has the characteristics of multi-purpose, wide range, and being able to measure at actual operating frequencies. The variable capacitance or variable frequency (passband) method is the foundation of various microwave Q-value measurement methods (Figure 2). Change the capacitance C or frequency f to measure the resonance curve of the resonant circuit, and then calculate the Q value of the circuit, which is Q=2C0/C (variable capacitance method) or Q=f0/f (variable frequency method). In practical applications, the measured resonant circuit often needs to be connected to the external circuit, and its resonant characteristics are not only related to the characteristics of the tested circuit itself, but also to the load situation of the external circuit. That is, the measured Q value is not the inherent unloaded Q value (Q0) of the tested circuit, but the loaded Q value (QL)

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