Electronics
Screening and testing of discrete semiconductor devices
Screening and testing of discrete semiconductor devices
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Screening and testing of discrete semiconductor devices

Testing project: Semiconductor testing

Testing cycle: 7-15 working days to issue testing report

Testing scope: Conductor, semiconductor, lighting, lighting, lamps, optics, street lamps, etc.

Characteristic testing projects

(1) Optical, electrical, thermal performance and interface testing: temperature rise test and thermal distribution, etc.

(2) Electromagnetic compatibility: Conducted disturbance, magnetic induced current radiation, harmonic current, electrostatic discharge, surge, etc.

Ringing wave immunity

(3) Safety regulations testing: electrical parameters, dielectric strength, insulation resistance, leakage current, anti electric shock structure inspection, grounding regulations and conduction resistance, creepage distance and electrical clearance, ball pressure test, temperature rise test

(4) Environment and reliability: high temperature, low temperature, temperature shock, constant damp heat, alternating damp heat, salt spray, vibration

(5) Material identification and lighting engineering acceptance: packaging of LED light sources Identification of chips, power supplies, and controllers. Indoor and outdoor lighting brightness and illuminance testing and simulation; Indoor illumination and lighting testing and analysis evaluation of buildings

Testing cost: free initial inspection, After initial inspection, quotation will be made based on customer testing needs and experimental complexity.

Testing standards

AS 1852.521-1988 International Electrotechnical Vocabulary Part 521: Semiconductor devices and integrated circuits

AS 60269.4.0-2005 Low voltage fuses Part 4.0: Supplementary requirements for fuses for semiconductor device protection (IEC 60269-4:1986/Amd. 1:1995) Replacing AS 2005.40:1989

AS/NZS 1102.105-1997 Electronic Technical Documentation Graphical Symbols Part 105: Semiconductors and Electronic Tubes IEC 617-5:1996

AS/NZS 1660.2.1-1998 Test Methods for Sheathed Conductors of Electronic Cables 2.1: Integrated Application Methods for Insulated Extruded Semiconductor Shields and Non metallic Enclosures 2.1: First Revision on February 1, 2001

AS/NZS 1660.2.2-1998 Test Methods for Sheathed Conductors of Electronic Cables 2.2: Insulated Extruded Half Specific Methods for Conducting Shields and Non metallic Enclosures of Artificial Rubber XLPE XLPVC Materials, First Revision on July 1, 2001

AS/NZS 1660.2.3-1998 Test Methods for Sheathed Conductors of Electronic Cables, Method 2.3: Specific Methods for Insulated Extruded Semiconductor Shields and Non metallic Enclosures of PVC and Halogen Thermoplastic Materials, First Revision on June 2000

AS/NZS 1660.2.4-1998 Test Methods for Sheathed Conductors of Electronic Cables, Method 2.4: Insulated Extrusion Specific Methods for Polyethylene Polypropylene Materials for Semiconductor Shielding and Non metallic Enclosures. First Revision in July 2001.

AS/NZS 1660.2.5-1998 Test Methods for Sheathed Conductors of Electronic Cables. Method 2.5: Specific Methods for Insulated Extruded Semiconductor Shielding and Non metallic Enclosures for Cables above 1kV. First Revision in February 2001. Second Revision in July 2001.

AS/NZS 3947.4.3-2000 Low Voltage Switchgear and Controller-Part 4.3: Contactors and Electrical Equipment Alternative to AS 1029.2:1982 for AC semiconductor controllers and contactors for non motor loads in motor starters

ASTM D4325-2013 Test Method for Nonmetallic Semiconductor Electrical Insulation Rubber Tape

Function of testing report:

1. Project bidding: Issue authoritative third-party CMA/CNAS qualification report

2. Online e-commerce platform entry: Quality inspection report recognized by major e-commerce platforms

3. Used as a sales report: issuing legally effective testing reports to make consumers more confident

4. Papers and research: Provide professional personalized testing needs

5. Judicial services: providing scientific, fair, and accurate testing data

6. Industrial problem diagnosis: Verify the troubleshooting and correction of industrial production problems

Baijian and testing process:

1. Telephone communication and confirmation of requirements

2. Recommend solutions and confirm quotations

3. Mail samples and arrange testing

4. Progress tracking and result feedback

5. Provide reports and after-sales service

6. If urgent or priority processing is required

Testing and testing characteristics:

1. The testing industry is fully covered, meeting different testing needs

2. Fully cover the laboratory and allocate localized testing nearby

3. Engineers provide one-on-one services to make testing more accurate

4. Free initial testing, with no testing fees charged

5. Self service order delivery for free on-site sampling

6. Short cycle, low cost, and attentive service

7. Possess authoritative qualifications such as CMA, CNAS, CAL, etc

8. The testing report is authoritative and effective, and is generally used in China