Abstract: Currently, most cellular phones adopt the Time Division Multiple Access (TDMA) standard, which uses a multiplexing technique to modulate the on/off pulse of high-frequency carriers at a frequency of 217Hz. The IC that is susceptible to RF interference will demodulate the carrier signal and regenerate a signal with 217Hz and its harmonic components. Due to the fact that the vast majority of these spectral components fall into the audio range, they produce annoying "buzzing" sounds At present, most cellular phones adopt the Time Division Multiple Access (TDMA) standard, which multiplexes high-frequency carriers with on/off pulse modulation at a frequency of 217Hz. The IC that is susceptible to RF interference will demodulate the carrier signal and regenerate a signal with 217Hz and its harmonic components. Due to the fact that the vast majority of these spectral components fall into the audio range, they produce annoying "buzzing" sounds. It can be seen that circuits with poor RF anti-interference ability will demodulate the RF signal of cellular phones and produce unwanted low-frequency noise. As a quality assurance testing method, the circuit needs to be placed in an RF environment during measurement, which is equivalent to the working environment of the circuit during normal operation This article explains a universal RF noise suppression measurement technique for integrated circuits. The RF anti-interference ability test places the circuit board at a controllable RF signal level, which represents the possible interference intensity that the circuit may experience during operation. This has resulted in a standardized and structured testing method that can yield reproducible test results in quality analysis. Such test results are helpful for IC selection, thus obtaining circuits that can resist RF noise The DUT can be placed close to the working cellular phone to test its RF sensitivity. However, in order to obtain accurate and reproducible test results, it is necessary to use a fixed measurement method to test the DUT in a reproducible RF field. The solution is to use an RF test anechoic chamber to provide a precisely controllable RF field, equivalent to the RF field generated by a typical mobile phone
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